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Focused Ion Beam Technician

Job in Santa Clara, Santa Clara County, California, 95053, USA
Listing for: Adecco US, Inc.
Full Time position
Listed on 2026-01-09
Job specializations:
  • Automotive
    Electronics Technician, Quality Engineering
Salary/Wage Range or Industry Benchmark: 32 - 33.5 USD Hourly USD 32.00 33.50 HOUR
Job Description & How to Apply Below

Adecco is hiring immediately for a Focused Ion Beam Technician with a local client in Santa Clara, CA. Pay is $32.00/hr - $33.50/hr.

Duties:
  • Shift: 10 Hr Night (Mon-Thu) 9pm-7am

  • Prepare samples for experiments, including sample coating, wafer cleaving, mounting/unmounting samples, and preparing jobs for experimentation to evaluate the performance of the process system.

  • Prepare transmission electron microscope (TEM) ella samples using focused ion beam (FIB), optimize sample preparation procedures and conditions, and identify cutting locations based on pattern instructions.

  • Operate metrology tools in the FIB & TEM lab to understand cross-section or top-view critical dimensions (CD), identify patterns of interest, understand image quality requirements and sample/beam interactions to determine optimized conditions, and complete requested jobs under limited supervision after training.

  • Understand the basic principles of scanning electron microscopy (SEM), focused ion beam (FIB), and transmission electron microscopy (TEM).

  • Perform SEM/FIB system and routine maintenance procedures such as flash, plasma cleaning, and image calibrations.

  • Perform routine troubleshoot procedures, identify problems, restart or standby the tool. Coordinate instrument repair and maintenance.

  • Interface with requestors, understand their detailed requirements, and communicate results. Coordinate with engineering on job request status.

  • Help monitor job queue and maintain lab throughput.

  • Document redo and lessons learned to lower redo rate.

  • Adhere to lab protocols and SOPs.

  • Operate supportive metrology equipment in a lab environment.

  • Operate supportive metrology equipment for FIB-TEM lamella samples.

  • Monitor data and track performance of metrology equipment and production activities per equipment requirements.

Qualifications:
  • Understand the basic principles of scanning electron microscopy (SEM), focused ion beam (FIB), and transmission electron microscopy (TEM).

  • Education:

    Technical Diploma Skills Certifications.

  • Years of

    Experience:

    2-4 Years Work Experience.

  • Ability to lift up to 30 lbs.

Benefits:

Benefit offerings include medical, dental, vision, life insurance, short-term disability, additional voluntary benefits, EAP program, commuter benefits and 401K plan. Our program provides employees the flexibility to choose the type of coverage that meets their individual needs. Available paid leave may include Paid Sick Leave, where required by law; any other paid leave required by Federal, State, or local law; and Holiday pay upon meeting eligibility criteria.

Pay

Details:

$32.00 to $33.50 per hour

Equal Opportunity Employer/Veterans/Disabled

Military connected talent encouraged to apply

The Company will consider qualified applicants with arrest and conviction records in accordance with federal, state, and local laws and/or security clearance requirements, including, as applicable:

  • The California Fair Chance Act
  • Los Angeles City Fair Chance Ordinance
  • Los Angeles County Fair Chance Ordinance for Employers
  • San Francisco Fair Chance Ordinance

Massachusetts Candidates Only: It is unlawful in Massachusetts to require or administer a lie detector test as a condition of employment or continued employment. An employer who violates this law shall be subject to criminal penalties and civil liability.

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