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PhD in Wafer-Scale Metrology SiC Photonics

Job in Germany, Pike County, Ohio, USA
Listing for: Friedrich-Alexander University Erlangen-Nurnberg
Part Time position
Listed on 2026-02-03
Job specializations:
  • Education / Teaching
Job Description & How to Apply Below
Position: PhD in Wafer-Scale Metrology for SiC Photonics
Location: Germany

An esteemed German university is seeking a highly motivated candidate for a part-time PhD position focused on Metrology at the wafer level. This role is part of a prestigious international project on Silicon Carbide integrated circuits, involving collaboration with 15 doctoral students across five countries. Candidates should have a relevant master's degree and good English skills. The position includes mandatory international training and secondment, contributing to advanced research in semiconductor materials.
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