Postdoctoral Fellow; PREP

Department/Program

Office of Research and Translation

Postdoctoral Research Associate in Electron Microscopy – Strain Measurement

This position is part of the National Institute of Standards and Technology (NIST) Professional Research Experience (PREP) program. The postdoctoral researcher will work on a CHIPS for America Act–funded project to develop robust, quantitative methods for measuring mechanical strain in real‑world semiconductor devices. The goal is to improve existing techniques (EBSD, TKD, 4‑D STEM, Raman, µXRD, etc.) and supply new reference materials to industry.

• Sample preparation via focused ion beam methods.
• Collecting and processing of 4
  
  DSTEM and other electron microscopy data.
• Presenting results at internal meetings and, on occasion, with external stakeholders.
• Ensuring that results, protocols, software, and documentation are archived or otherwise transmitted to the larger organization.

• Ph.D. in Physics, Materials Science, or a related field with a concentration in electron microscopy methods.
• Experience in the collection and processing of TEM/STEM data.
• Computer programming for custom data processing.
• Strong oral and written communication skills.

• Upload a CV/Resume (limit to 3 pages).
• Phone number.
• Home address/Country.
• Languages spoken.

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